Contact: +91-9711224068
International Journal of Applied Research
  • Multidisciplinary Journal
  • Printed Journal
  • Indexed Journal
  • Refereed Journal
  • Peer Reviewed Journal

ISSN Print: 2394-7500, ISSN Online: 2394-5869, CODEN: IJARPF

Impact Factor: RJIF 5.2

International Journal of Applied Research

Vol. 1, Issue 12, Part M (2015)

Defect detection algorithm for semiconductor ice package by image analysis method

Author(s)
Suvriti Dhawan, Anmol Taploo, Mohit Vishal
Abstract
This paper aims at developing a defect detection algorithm for semiconductor IC package by image analysis of a single captured image, without reference to another image during inspection. The integrated(IC) pattern is usually periodic and regular. We propose a method where the defect detection algorithm first segments the captured image into different regions by asset of morphological segmentations with different structuring element sizes. Then a region properties, is calculated for each segmented region. Lastly, the defective region is extracted by the region properties of the image. The experimental results are promising. Future work will focus on variant orientation of a IC package.
Pages: 865-867  |  411 Views  14 Downloads
How to cite this article:
Suvriti Dhawan, Anmol Taploo, Mohit Vishal. Defect detection algorithm for semiconductor ice package by image analysis method. International Journal of Applied Research. 2015; 1(12): 865-867.
Call for book chapter
Journals List Click Here Research Journals Research Journals