Contact: +91-9711224068
International Journal of Applied Research
  • Multidisciplinary Journal
  • Printed Journal
  • Indexed Journal
  • Refereed Journal
  • Peer Reviewed Journal

ISSN Print: 2394-7500, ISSN Online: 2394-5869, CODEN: IJARPF

IMPACT FACTOR (RJIF): 8.4

Vol. 2, Issue 5, Part E (2016)

Study of static noise margin of SRAM based on supply voltage and topologies

Study of static noise margin of SRAM based on supply voltage and topologies

Author(s)
P Shanmugavadivu, S Sugunadevi, B Sukanya
Abstract
This paper deals with the study of dependence of Static Noise Margin of SRAM on supply voltage and circuit topologies. Computation of Static Noise Margin of conventional 6T SRAM cell using butterfly curve and its corresponding read & writes operation where explained. This paper also investigates the effects of supply voltage, temperature & sizing of the transistors on SRAM performance. The results of SNM for various topologies and modifications in topologies for improving the performance in the subthreshold region and increasing the speed of the SRAM cell were discussed.
Pages: 285-288  |  1203 Views  126 Downloads
How to cite this article:
P Shanmugavadivu, S Sugunadevi, B Sukanya. Study of static noise margin of SRAM based on supply voltage and topologies. Int J Appl Res 2016;2(5):285-288.
Call for book chapter
International Journal of Applied Research
Journals List Click Here Research Journals Research Journals