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International Journal of Applied Research
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ISSN Print: 2394-7500, ISSN Online: 2394-5869, CODEN: IJARPF

IMPACT FACTOR (RJIF): 8.4

Vol. 3, Issue 8, Part L (2017)

Mobility of InN and Seebeck coefficient of InN based on the two-layer model

Mobility of InN and Seebeck coefficient of InN based on the two-layer model

Author(s)
Bhuvan Bhasker Srivastava and Shad Husain
Abstract
InN has been grown on sapphire substrate by metal organic chemical vapor deposition (MOCVD) and molecular beam epitaxial method. InN grown on sapphire or other substrate develops large numbers of dislocations at the interface. The dislocations affect the electrical properties of InN significantly. The theoretical values of mobility and thermo electric power of InN calculated based on two-layer model are in good agreement with the experimental data. Dislocations in InN crystal have adverse effect on the mobility and thermoelectric power as well.
Pages: 945-948  |  300 Views  60 Downloads
How to cite this article:
Bhuvan Bhasker Srivastava, Shad Husain. Mobility of InN and Seebeck coefficient of InN based on the two-layer model. Int J Appl Res 2017;3(8):945-948.
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