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ISSN Print: 2394-7500, ISSN Online: 2394-5869, CODEN: IJARPF

International Journal of Applied Research

Vol. 2, Issue 2, Part E (2016)

Selection of Bayesian single sampling plan for attributes based on prior binomial distribution

Author(s)
Dr. V Yuvaraj
Abstract
In Bayesian single sampling plan, the acceptance probability of lots are calculated by considering an appropriate prior distribution. The purpose of this paper is to demonstrate the use of Bayesian methods in acceptance sampling for items which are categorized according to their attributes as the defectives or non-defectives. The main thrust of the paper is to propose the model for minimizing the average cost over different combinations of (ni, ci) with respect to A2i (the cost associated with a defective item which is accepted), for picking up the optimal Bayesian single sampling plan for attributes. The performance of Bayesian binomial single sampling plan is also discussed by determining the operating characteristic curve.
Pages: 303-305  |  678 Views  9 Downloads
How to cite this article:
Dr. V Yuvaraj. Selection of Bayesian single sampling plan for attributes based on prior binomial distribution. Int J Appl Res 2016;2(2):303-305.
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